MeitY and BITS Pilani Signed MoU to Launch Cybersecurity Professional Development Programme for Government and Industry Professionals.

MOUs and Agreement

The Ministry of Electronics and Information Technology (MeitY)—through its national cyber‑defence agency CERT‑In (Indian Computer Emergency Response Team)—has signed a MoU with Birla Institute of Technology & Science (BITS), Pilani Group, to launch an eight‑week Professional Development Program in Cybersecurity for professionals across government, public sector undertakings (PSUs), and private industry.


      - The program, set to begin on 19 July 2025, will be hosted at the Centre for Research Excellence in National Security (CRENS) on the BITS Pilani Hyderabad Campus, with support from technology partner Rapifuzz and guided by CERT‑In. It is uniquely open to professionals without prior coding experience, reflecting an inclusive, capacity‑building design.

      - Participants will develop expertise in cyber threats and vulnerabilities, network security (firewalls, intrusion detection/prevention systems, VPNs), secure communications and cryptography, incident management and forensics, along with advanced modules on cloud security, mobile threats, and advanced persistent threats (APTs). Graduates will earn a co‑branded Professional Development Certificate in Cybersecurity jointly issued by CERT‑In and BITS Pilani, combining academic rigor with national credibility.

     

Main Point :-   (i) This initiative marks the first time CERT‑In—the national nodal agency designated under Section 70B of the Information Technology Act, 2000—has formally partnered with a premier academic institution to deliver cybersecurity training at scale.

      (ii) CERT‑In DG Dr Sanjay Bahl described the program as a key step in building “a vibrant, highly skilled talent pool…poised to meet evolving digital and quantum‑era challenges,” while Dr V. Ramgopal Rao, Group Vice‑Chancellor of BITS Pilani, noted it exemplifies the strength of the academia‑industry‑government collaboration.


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